
KLA-TENCOR SURFSCAN 6220 (SFS 6220)
- Manufacturer: KLA-Tencor
- Model: Surfscan 6220
KLA-Tencor Surfscan 6220 (SFS 6220) Wafer Surface Contamination Analysis System The SFS 6220 tool is used for wafer surface contamination analysis of unpatterned semiconductor wafers. System is calibrated, tes...

1993 KLA Tencor SFS-6200
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
Tencor Surfscan 6200 particle counter Part machine
Yongin-si, South Korea

