- Trusted Seller

KLA-Tencor AIT II Patterned Surface Defect Inspection System
- Manufacturer: KLA-Tencor
- Model: AIT II
KLA-TENCOR AIT II (200mm/300mm) PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT II- Wafer Size: 200mm- 150/200mm Open Handler - Software Version 5.3.17.4- Double Darkfield Inspection Tool -...
Decatur, GA - Trusted Seller

KLA-Tencor AIT I Patterned Surface Defect Inspection System consisting
- Manufacturer: KLA-Tencor
- Model: AIT I
KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...
Decatur, GA - Trusted Seller

KLA-Tencor AIT I Patterned Surface Defect Inspection System
- Manufacturer: KLA-Tencor
- Model: AIT I
KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...
Decatur, GA - Trusted Seller

KLA-Tencor SP1 TBI Unpatterned Surface Inspection System
- Manufacturer: KLA-Tencor
- Model: SP1
KLA-TENCOR SP1 TBI UNPATTERNED SURFACE INSPECTION SYSTEM consisting of: - Model: SP1 TBI- Up to 300mm Wafers- Inquire about Handler Options for Various Size Wafers- Unpatterned Surface Inspection System - Wafer M...
Decatur, GA - Trusted Seller

1997 KLA AIT I Main System
- Manufacturer: KLA-Tencor
- Model: AIT I
Currently Configured for 6"/150mm & 8"/200mm Wafers Double Darkfield Inspection Tool SECS II/GEM Communication Interface Low Contact Chuck (AIT I) Multi Channel Collection Optics System with Independent Progr...
United States - Trusted Seller

KLA 2132 Wafer Inspection System
- Manufacturer: KLA-Tencor
Serial number W21XX639 can be sold "as is" or operational to oem specs. Deinstalled by KLA, Warehoused, barrier bagged. The system was deinstalled in september 2002 and until that date was upgraded with various h...
Trim, Ireland

