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    KLA Tencor Surfscan 6200 Particle

    KLA Tencor Surfscan 6200 Particle Inspection System

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 6200

    KLA-TENCOR SURFSCAN 6200 PARTICLE INSPECTION SYSTEM consisting of:- Model: 6200 Surfscan- Particle Inspection System- Max Wafer Capable: 8”/200mm- System configured for 8“/200mm wafers- Defect Sensitivity: 0.12um...

    Decatur, GA
  • KLA-TENCOR SURFSCAN 6220 (SFS 6220)

    KLA-TENCOR SURFSCAN 6220 (SFS 6220)

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 6220

    KLA-Tencor Surfscan 6220 (SFS 6220) Wafer Surface Contamination Analysis System The SFS 6220 tool is used for wafer surface contamination analysis of unpatterned semiconductor wafers. System is calibrated, tes...

    $171,540 USD

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    Est. $3,228/mo

    San Jose, CA