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Used KLA-Tencor 2139 Metrology / Inspection (Semiconductors)

  • Trusted Seller
    2001 KLA 2139

    2001 KLA 2139

    • Manufacturer: KLA-Tencor
    • Model: 2139

    This is a brightfield patterned surface defect inspection system. The tool is complete 8"/200mm OEM Model Description The 2139 wafer inspection system offers sensitivity and productivity enhancements for IC ma...

    Asia
  • 2000 KLA 2139

    2000 KLA 2139

    • Manufacturer: KLA-Tencor
    • Model: 2139

    Wafer size: 8" | Process: MET | Shipping: EXW

    South Korea