Jeol DEF AMP 2 PB MP003384-00 for Jeol JEM 1230 TEM Electron Microscope
- Manufacturer: Jeol
Jeol DEF AMP 2 PB MP003384-00. Unit is used and working. Pulled from a Jeol JEM 1230 TEM Electron Microscope. Was Labeled "DEF AMP2" in chassis. Info on Board: Jeol DEF AMP 2 PB MP003384-00 OK031302C NO: EM184400...
$899 USDFayette, ALJeol LENS DEF ITF PB MP003381-01 for Jeol JEM 1230 TEM Electron Microscope
- Manufacturer: Jeol
Jeol LENS DEF ITF PB MP003381-01. Unit is used and working. Pulled from a Jeol JEM 1230 TEM Electron Microscope. Was Labeled "L/D ITF" in chassis. Info on Board: Jeol LENS DEF ITF PB (035) MP003381-01 OK03 3242C ...
$799 USDFayette, ALJeol DEF AMP 1 PB MP003383-00 for Jeol JEM 1230 TEM Electron Microscope
- Manufacturer: Jeol
Jeol DEF AMP 1 PB MP003383-00. Unit is used and working. Pulled from a Jeol JEM 1230 TEM Electron Microscope. Was Labeled "DEF AMP1" in chassis. Info on Board: Jeol DEF AMP 1 PB MP003383-00 OK02Y292C NO: EM184400...
$899 USDFayette, AL- Trusted Seller

Jeol JCM 5700
- Manufacturer: Jeol
Jeol Raster Electron Microscope JCM 5700 Carry Scope. Pfeiffer Vacuum Rotary Vane Pump DUO 2.5. With Jeol Sputter 1200 Fine Coater. Computer. Monitor. Software. Operating system WinXP. Year of manufacture 2008. O...
Burladingen, Germany 
JEOL JWS-7555
- Manufacturer: Jeol
For sale is a high-performance JEOL JWS-7555 Scanning Electron Microscope (SEM), known for its advanced imaging capabilities and precision. This SEM is ideal for a wide range of applications, including semiconduc...
- Trusted Seller

Jeol JSM T200
- Manufacturer: Jeol
- Model: JSM
Jeol Raster Electron Microscope JSMT 200. Resolution 10 nm at 25 kV and 20 mm working distance. Magnification 15x to 100,000x Company: Jeol Model: JSM T200 Comment: Documents English. The following illustrations ...
Burladingen, Germany 
2018 Jeol JSM-IT200LV InTouchScope Scanning Electron Microscope
- Manufacturer: Jeol
- Model: JSM
Jeol JSM-IT200LV InTouchScope Scanning Electron Microscope IXRF EDS detector included DOM: 2018 High resolution imaging in HV/LV/SE/BSE Zeromag-mode for intuitive transition from light-optic to SEM image Che...
United States

