JEOL JSM-T220A Scanning Microscope
used
- Manufacturer: Jeol
- Model: JSM
JEOL JSM-T220A Scanning Microscope, the unit sold as is. It was not tested. • The sale of this item may be subject to regulation by the U.S. Food and Drug Administration and state and local regulatory agencies. I...
$2,500 USDBaltimore, MD- Trusted Seller
JEOL JEM-2100 JEM-2500 etc. SEM Microscope Goniometer SEG Calibration Plug Kit.
used
- Manufacturer: Jeol
“Used Kit in Case” JEOL JEM-2100 JEM-2500 etc. SEM Microscope Goniometer SEG Calibration Plug Kit Used Kit in Case. Actual Kit Shown, HUGE SAVINGS! Goniometer Blanking Plug Goniometer Jig Plug Horizontal Drive Pl...
$960 USDGilbert, IA - Trusted Seller
JEOL Jeol JSM-5910LV SEM Scanning Electron Microscope Lab
used
- Manufacturer: Jeol
- Model: JSM
This Jeol JSM-5910LV SEM Scanning Electron Microscope was removed from a university lab where it was surplus to requirements. The system has not been tested. The Oxford dewar has come away from the unit and dent...
United States - Trusted Seller
JEOL JEOL JASM-6200 Atmospheric Scanning Electron Microscope Clairescope Lab
used
- Manufacturer: Jeol
This JEOL JASM-6200 Atmospheric Scanning Electron Microscope Clairescope was removed from a university lab where it was surplus to requirements. It is in good cosmetic condition with minor marks from use. The l...
United States Jeol JWS-7505 Wafer Inspection System Tilt SEM Scanning Electron Microscope
used
- Manufacturer: Jeol
Home Contact About Technology Industrial Lab & Test Electrical Semiconductor Jeol JWS-7505 Wafer Inspection System Tilt SEM Scanning Electron Microscope Manufacturer: Jeol Model: JWS-7505 Condition: For Parts or ...
- Trusted Seller
2018 Jeol JSM-IT200LV InTouchScope Scanning Electron Microscope
used
- Manufacturer: Jeol
- Model: JSM
Jeol JSM-IT200LV InTouchScope Scanning Electron Microscope IXRF EDS detector included DOM: 2018 High resolution imaging in HV/LV/SE/BSE Zeromag-mode for intuitive transition from light-optic to SEM image Che...
United States - Trusted Seller
JEOL JWS-7555 scanning electron microscope
used
- Manufacturer: Jeol
JEOL JWS 7555 is a scanning electron microscope (SEM) that utilizes an advanced electron optical equipment, providing a high level of image performance. It is suitable for a wide range of applications, including ...
United States - Trusted Seller
JEOL JSM-T300 SCANNING MICROSCOPE M6741
used
- Manufacturer: Jeol
- Model: JSM
Warranty Information FOR PARTS OR REPAIR- THIS ITEM IS BEING SOLD AS IS, AS PICTURED. AS THIS IS FOR PARTS OR REPAIR NO RETURNS WILL BE ACCEPTED. Includes the set of diagrams and the logbook Selling unit just as ...
$3,500 USDEl Paso, TX - Trusted Seller
2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope
used
- Manufacturer: Jeol
Jeol 2100 Probe-Corrected Analytical Electron Microscope - Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with EDS, EELS/EFTEM for elemental mapping and thickness measur...
United States - Trusted Seller
2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope
used
- Manufacturer: Jeol
- Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with EDS, EELS/EFTEM for elemental mapping and thickness measurements - Acceleration Voltage: 100 and 200 kV - Filament...
United States - Trusted Seller
JEOL JSM-IC25S SCANNING MICROSCOPE CONTROL
used
- Manufacturer: Jeol
- Model: JSM
Warranty Information For parts or repair- This item is being sold as is, as pictured. As this is for parts or repair no returns will be accepted. Unit removed from Joel JEM-100CX Electron Microscope. System last ...
$999 USDEl Paso, TX - Trusted Seller
JEOL MP-94070 ELECTRON DETECTOR MICROSCOPE T235599
used
- Manufacturer: Jeol
Warranty Information THIS IS A USED ITEM, IN GOOD CONDITION AND INCLUDES A 30 DAY WARRANTY.
$300 USDEl Paso, TX - Trusted Seller
JEOL JSM-6700F Field Emission Scanning Electron Microscope Edax Detector
used
- Manufacturer: Jeol
- Model: JSM
This Jeol JSM-6700F Field Emission Scanning Electron Microscope Edax Detector is in good cosmetic condition with signs of use. There are a number of side panels that have been removed and set aside, I'm not sure...
United States - Trusted Seller
JEOL JSM-6300F SEM Scanning Electron Microscope Column Assembly Working Surplus
used
- Manufacturer: Jeol
- Model: JSM
- Model No: JSM-6300F Column - Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope System This JEOL JSM-6300F SEM Scanning Electron Microscope Column Assembly is used working surplus. The unit has som...
United States - Trusted Seller
JEOL JSM-6400F SEM Scanning Electron Microscope Column Assembly Working Surplus
used
- Manufacturer: Jeol
- Model: JSM-6400
- Model No: JSM-6400F Column - Made in Japan Installed Components - Part No: BEI Preamplifier - Part No: Noise Canceller Preamp - Edwards Part No: D14644000, AIM-SL-NW25 - Granville-Phillips Part No: 75 Convect...
United States