2001 KLA TENCOR VIPER 2410
- Manufacturer: KLA-Tencor
- Model: Viper 2410
KLA-Tencor's 2401 Automated Macro Defect Inspection System - Replacing the manual bright light macro defect inspection performed by operators. - Automated detection, classification and reporting of all yield- cri...
Cheonan-si, South Korea
2007 RUDOLPH RUDOLPH MP1-300
- Manufacturer: Rudolph
- Model: MP 300
Wafer size: 12" | Process: Film thickness measurement | Shipping: EXW
South Korea
2009 RUDOLPH MP300
- Manufacturer: Rudolph
- Model: MP 300
Wafer size: 8" | Process: Film Thickness Measurement | Shipping: EXW
South Korea
South Korea
2004 RUDOLPH AXI-S
- Manufacturer: Rudolph
- Model: AXI
Wafer size: 12" | Process: Macro Inspection | Shipping: EXW
South Korea
South Korea
South Korea
South Korea
2004 RUDOLPH AXI_S
- Manufacturer: Rudolph
- Model: AXI
Wafer size: 12" | Process: Macro Inspection System | Shipping: EXW
South Korea
South Korea
RUDOLPH AXI-S
- Manufacturer: Rudolph
- Model: AXI
Wafer size: 12" | Process: Macro Inspection | Shipping: EXW
South Korea
South Korea
South Korea
2003 RUDOLPH AXI_S
- Manufacturer: Rudolph
- Model: AXI
Wafer size: 12" | Process: Defect Inspection | Shipping: EXW`
South Korea
South Korea
Advantest T3346 Test & Measurement (semiconductors)
- Manufacturer: Advantest
- Model: T3346
Good condition Advantest T3346 Test & Measurement (semiconductors)s. Located in South Korea and other countries. Click request price for more information.
South Korea
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