Used Test & Measurement (Semiconductors) in South Korea

BF-Planet XII

Through high-resolution 10um CCD line sensor camera 0402 chip and 0.4mm pitch lead, etc. inspection machine Scans M-size board (330mm*250mm) in about 9 seconds

AOI rental service

SAKI tester rental service

PA-500 Series Discontinued

Product Information Application of 5 Mega Pixel Camera (first in the world) 3D detection using 4 side-cameras Adoption of 4-division lighting system / 4 active lighting methods Minimize false defects by adopting ...

BF-Sirius

Optimal resolution for high-density mounting inspection L SIZE PCB (500mm*460mm) is scanned in about 10 seconds and within 18 seconds Inspection completed, simultaneous inspection of 2 or more M-size boards and m...

BF-10BT

Simultaneous inspection of both sides High resolution optimal for high-density mounting inspection Real-time defect management analysis Optimal for final process inspection As a double-sided simultaneous inspecti...

2011 KLA TENCOR Candela 8600

• Manufacturer: KLA-Tencor
• Model: Candela 8600

KLA-Tencor Candela 8600 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is manual wafer handling tool. The Candela defect detection system simulta...

2011 KLA TENCOR Candela 8600

• Manufacturer: KLA-Tencor
• Model: Candela 8600

KLA-Tencor Candela 8600 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is manual wafer handling tool. The Candela defect detection system simulta...

2012 KLA TENCOR Candeal 8620

• Manufacturer: KLA-Tencor
• Model: Candela 8620

KLA-Tencor Candela 8620 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is fully automated with integrated wafer handling for cassette-to-cassette...

2011 KLA TENCOR Candela 8620

• Manufacturer: KLA-Tencor
• Model: Candela 8620

KLA-Tencor Candela 8620 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is fully automated with integrated wafer handling for cassette-to-cassette...

2001 NIKON NWL641M

• Manufacturer: Nikon
• Model: NWL641

IC Inspection Wafer Loader Orientation flat/notch detection

2000 KLA TENCOR VIPER 2410

• Manufacturer: KLA-Tencor
• Model: Viper 2410

KLA-Tencor's 2401 Automated Macro Defect Inspection System - Replacing the manual bright light macro defect inspection performed by operators. - Automated detection, classification and reporting of all yield- cri...

1994 KLA TENCOR SFS 6200

• Manufacturer: KLA-Tencor
• Model: Surfscan 6200

*.Configuration: - Non-patterned surface Inspection System. - 0.1 micron Defect Sensitivity (PSL STD). - 0.02 ppm Haze Sensitivity. - 0.002 ppm Haze Resolution. - Accuracy within 1%. - XY coordinates. - Lock Down...

2001 KLA TENCOR VIPER 2410

• Manufacturer: KLA-Tencor
• Model: Viper 2410

KLA-Tencor's 2401 Automated Macro Defect Inspection System - Replacing the manual bright light macro defect inspection performed by operators. - Automated detection, classification and reporting of all yield- cri...

RUDOLPH AXI-S

• Manufacturer: Rudolph
• Model: AXI

Macro Inspection System to detect wafer level and die level defects. Up to 8" 2 Load Port

RUDOLPH AXI-930

• Manufacturer: Rudolph
• Model: AXI 930

Macro Inspection System to detect wafer level and die level defects. Up to 8" 2 Load Port Parts machine

Advantest T5593 Test & Measurement (semiconductors)

• Manufacturer: Advantest
• Model: T5593

Good condition Advantest T5593 Test & Measurement (semiconductors)s manufactured in 2004. Located in South Korea and other countries. Click request price for more information.