Semiconductors » Metrology / Inspection (semiconductors) » Defect Inspection » South Korea

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Used Defect Inspection in South Korea

  • 2009 HITACHI RS4000T

    2009 HITACHI RS4000T

    • Manufacturer: Hitachi
    • Model: RS-4000

    Wafer size: 12" | Shipping: EXW

    Seoul, South Korea
  • Hitachi, S-3000H, SEM (Scanning Electron

    Hitachi, S-3000H, SEM (Scanning Electron Microscope)

    • Manufacturer: Hitachi
    • Model: S-3000H

    Resolution 3.5nm, Specimens size 150mm diameter - DESCRIPTION: Resolution 3.5nm, Specimens size 150mm diameter - VINTAGE: Unknown - CONDITION: As-is

    Suwon-si, South Korea
  • 2011 HITACHI NB-5000

    2011 HITACHI NB-5000

    • Manufacturer: Hitachi
    • Model: NB5000

    Wafer size: N/A | Process: FIB Sem | Shipping: EXW

    South Korea
  • 2006 HITACHI HD2300A

    2006 HITACHI HD2300A

    • Manufacturer: Hitachi
    • Model: HD-2300A

    Wafer size: N/A | Process: Scanning Transmission Electron Microscope (STEM) | Shipping: EXW

    South Korea
  • HITACHI FB 2100

    HITACHI FB 2100

    • Manufacturer: Hitachi
    • Model: FB-2100

    Focused Ion Beam system

    Gyeonggi-do, South Korea
  • 2010 HITACHI LS9000

    2010 HITACHI LS9000

    • Manufacturer: Hitachi
    • Model: LS9000

    Shipping: EXW

    South Korea
  • 2003 HITACHI RS4000

    2003 HITACHI RS4000

    • Manufacturer: Hitachi
    • Model: RS-4000

    Wafer size: 12" | Process: DEFECT REVIEW SEM | Shipping: EXW

    South Korea
  • 2013 HITACHI RS6000

    2013 HITACHI RS6000

    • Manufacturer: Hitachi
    • Model: RS-6000

    Shipping: EXW

    South Korea
  • 2010 HITACHI IS3200SE

    2010 HITACHI IS3200SE

    • Manufacturer: Hitachi
    • Model: IS-3200SE

    Wafer size: 12" | Shipping: EXW

    South Korea
  • 2006 HITACHI IS2700E

    2006 HITACHI IS2700E

    • Manufacturer: Hitachi
    • Model: IS-2700SE

    HITACHI IS2700SE S/N 118A0101 Wafer size: 12" | Details: E beam inspection | Shipment: Packing and shipping is buyer's responsibility | Comments: HITACHI IS2700SE E beam inspection

    South Korea
  • 2003 HITACHI RS 4000

    2003 HITACHI RS 4000

    • Manufacturer: Hitachi
    • Model: RS-4000

    Wafer size: 12" | Process: Defect Review Sem | Shipping: EXW

    South Korea
  • 2003 HITACHI RS4000

    2003 HITACHI RS4000

    • Manufacturer: Hitachi
    • Model: RS-4000

    Wafer size: 12" | Process: Defect Review Sem | Shipping: EXW

    South Korea

Overview

Semiconductor metrology involves the measurement and analysis of semiconductor wafers and devices. This category includes tools and equipment used to ensure the precision and accuracy of semiconductor manufacturing processes. These instruments are vital for quality control, helping to detect defects and ensure that devices meet strict industry standards.

FAQ

What factors should I consider when buying semiconductor metrology equipment?

Consider the equipment's measurement accuracy, resolution, and compatibility with your specific semiconductor processes. Evaluate the vendor's support services and the equipment's ease of integration into your existing systems.

How can I ensure safe shipping of semiconductor metrology equipment?

Use a specialized shipping service experienced in handling sensitive and high-precision equipment. Ensure the equipment is well-packaged with proper cushioning and handling instructions.

What is the maintenance schedule for semiconductor metrology equipment?

Regular calibration and inspection are essential. Follow the manufacturer's guidelines for preventative maintenance, including cleaning optical components and checking for software updates. Maintain a log of all maintenance activities.