Used processing

Hitachi S-4700-II

• Manufacturer: Hitachi
• Model: S-4700

Process Type: FA SEMs/TEMs/Dual Beams Wafer Size: N/A Status of Equipment: Refurbished Configuration Type II stage with 5 axis motorization Type I load lock, 4 inch (optional 6 inch) Full control pad CD Me...

Hitachi Hightech TM1000 Tabletop Miscroscope

• Manufacturer: Hitachi
• Model: TM1000

Tabletop Scanning Electron Microscope, Model TM-1000 (Hitachi High-Technologies), is an easy-to-use introductory tool for microstructures at magnifications up to 10,000 x at a fixed working distance with minimal ...

2001 HITACHI S-9220

• Manufacturer: Hitachi
• Model: S-9220

The tool is complete with no known issues OEM Model Description The Hitachi S-9220 CD-SEM is a high-resolution, automated tool for precise CD measurements. It is designed for inline process control and developm...

Hitachi S-5500

• Manufacturer: Hitachi
• Model: S-5500

Process Type: FA SEMs/TEMs/Dual Beams Specifications: Secondary Electron image resolution: 0.4nm at 30kV and 1.6nm at 1kV Specimen Stage Stage Traverse: X: +3.5mm, Y: +2.0mm, Z:+0.3mm, T: +40 degrees Sample ...

2012 HITACHI SU-8040

• Manufacturer: Hitachi
• Model: SU8040

Vintage: 2012 Process Type: FA SEMs/TEMs/Dual Beams Equipment Information: Status of Equipment: Refurbished Specification: Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.3nm (1kV, WD=1.5mm, De...

Hitachi S-4800-II

• Manufacturer: Hitachi
• Model: S-4800

Vintage: 2004/2007 Process Type: FA SEMs/TEMs/Dual Beams Status of Equipment: Refurbished Specification: Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.4nm (1kV, WD=1.5mm, Deceleration mode) 2...

2008 Hitachi SU-70

• Manufacturer: Hitachi
• Model: SU70

Process Type: FA SEMs/TEMs/Dual Beams Wafer Size: N//A Date of Manufacture: 2008 Equipment Information: Status of Equipment: Refurbished Resolution Imaging; 1 nm/15 kV, 1.6 nm/1 kV In-lens SE and BSE Signal...

ETCH PROCESS PUMP

• Manufacturer: Hitachi
• Model: S-8820

1997 Hitachi S-4500 II Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-4500

- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guaranteed (at accelerating voltage 1 kV, working distance 3mm) Magnification: ...

1997 Hitachi S-4500 II Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-4500

- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guaranteed (at accelerating voltage 1 kV, working distance 3mm) Magnification: ...

1997 Hitachi S-4500 Type 11

• Manufacturer: Hitachi
• Model: S-4500

Scanning Electron Microscope (SEM) Wafer Size: Equipment Configuration: – Type II – EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guarant...

1998 Hitachi S 5000 Field Emission Scanning Electron Microscope

• Manufacturer: Hitachi
• Model: S-5000

- Ultra High Resolution - Accelerating Voltage: 30 kV - Magnification: 500,000x Performance - Image Resolution: 0.6 nm (at 30 kV),3.5 nm (at 1 kV) in secondary electron image Magnification - Low mag mode: x...

Hitachi S 3000 N Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-3000N

- Variable Pressure (Low Vacuum) - 6" Stage - Windows XP Operating System - HP DC 7600 - Software Options: - Measurement - PCI Interface (Image management) - H.R. Image Memory - SEM Data Management - Ful...

1997 Hitachi S-7800

• Manufacturer: Hitachi
• Model: S-7800

Process Type: Metrology & Inspection Wafer Size: 200mm Date of Manufacture: Aug 1997 Status of Equipment: Refurbished Hitachi S-7800, includes dry EDX detector and system. Configured for 8 inch wafers, howeve...

Hitachi HD-2300

• Manufacturer: Hitachi
• Model: HD-2300

Process Type: FA SEMs/TEMs/Dual Beams Wafer Size: N/A Status of Equipment: Warehouse 200kV dedicated STEM with thermal FE election source Resolution 0.204nm Phase contract image (TE image), Z-contrast image ...