Used Hitachi Metrology / Inspection (Semiconductors)

Hitachi Wafer Prealigner S-9300 CD Scanning Electron Microscope System Working

• Manufacturer: Hitachi
• Model: S-9300

“Removed from a Hitachi S-9300 CD Scanning Electron Microscope System” Hitachi Wafer Prealigner S-9300 CD Scanning Electron Microscope System Working Removed from a Hitachi S-9300 CD Scanning Electron Microscope ...

Hitachi SEM Power Distribution Box S-9380 Used Working

• Manufacturer: Hitachi
• Model: S-9380

Hitachi S-9380 SEM Power Distribution Box used working surplus Inventory # AA-3533 This Hitachi power distribution box is used working surplus. The physical condition is good, but there are signs of previous use...

Hitachi

• Manufacturer: Hitachi

Hitachi S-8820

• Manufacturer: Hitachi
• Model: S-8820

Installed in fab – powered off waiting de-install. Complete. No known issues.

HITACHI SU-70

• Manufacturer: Hitachi
• Model: SU70

Hitachi SU-70, Ultra-high resolution analytical Scanning Electron Microscope SEM Model SU-70 is a new-concept SEM, incorporating Hitachi’s field proven semi-in-lens technology for ultra-high resolution with a Sc...

Hitachi S 4500 Scanning Electron Microscope (SEM)

• Manufacturer: Hitachi
• Model: S-4500

2001 HITACHI S-9220

• Manufacturer: Hitachi
• Model: S-9220

The tool is complete with no known issues OEM Model Description The Hitachi S-9220 CD-SEM is a high-resolution, automated tool for precise CD measurements. It is designed for inline process control and developm...

Hitachi S-8820

• Manufacturer: Hitachi
• Model: S-8820

De-installed in storage. Complete. Known issue is transfer arm in exchange chamber needs to be replaced.

Hitachi S-5500

• Manufacturer: Hitachi
• Model: S-5500

Process Type: FA SEMs/TEMs/Dual Beams Specifications: Secondary Electron image resolution: 0.4nm at 30kV and 1.6nm at 1kV Specimen Stage Stage Traverse: X: +3.5mm, Y: +2.0mm, Z:+0.3mm, T: +40 degrees Sample ...

1998 Hitachi S 5200

• Manufacturer: Hitachi
• Model: S-5200

Hitachi S 5000 Field Emission Scanning Electron Microscope (SEM) Working condition. - Ultra high resolution 1998 Vintage

Hitachi S-4800-II

• Manufacturer: Hitachi
• Model: S-4800

Vintage: 2004/2007 Process Type: FA SEMs/TEMs/Dual Beams Status of Equipment: Refurbished Specification: Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.4nm (1kV, WD=1.5mm, Deceleration mode) 2...

Hitachi S-4700-II

• Manufacturer: Hitachi
• Model: S-4700

Process Type: FA SEMs/TEMs/Dual Beams Wafer Size: N/A Status of Equipment: Refurbished Configuration Type II stage with 5 axis motorization Type I load lock, 4 inch (optional 6 inch) Full control pad CD Me...

2008 Hitachi SU-70

• Manufacturer: Hitachi
• Model: SU70

Process Type: FA SEMs/TEMs/Dual Beams Wafer Size: N//A Date of Manufacture: 2008 Equipment Information: Status of Equipment: Refurbished Resolution Imaging; 1 nm/15 kV, 1.6 nm/1 kV In-lens SE and BSE Signal...

1995 Hitachi S 4500

• Manufacturer: Hitachi
• Model: S-4500

Type: Field Emission Scanning Electron Microscope (FE-SEM)