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HITACHI MODEL S-3500N SCANNING ELECTRON BEAM MICROSCOPE CRATED FOR SHIPPING
- Manufacturer: Hitachi
- Model: S-3000N
HITACHI MODEL S-3500N SCANNING ELECTRON BEAM MICROSCOPE CRATED FOR SHIPPING SEMs have been used for the evaluation of minute materials and have become an important tool for research and development in various fie...
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1999 HITACHI S 8840 Critical Dimension Scanning Electron Microscope
- Manufacturer: Hitachi
- Model: S-8840
Hitachi S 8840 Critical Dimension Scanning Electron Microscope (CD SEM) 8" - Single Phase - 50 A - 100V Missing parts: -Turbo Controller -Sensor -2 Unit -Lamp for alignment 1 Unit -Pirani Gauge 1 Unit 1...
United States
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