Building Filters

6

Used accessories in Chungcheongnam-do, South Korea

1994 KLA TENCOR SFS 6200
- used
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
*.Configuration: - Non-patterned surface Inspection System. - 0.1 micron Defect Sensitivity (PSL STD). - 0.02 ppm Haze Sensitivity. - 0.002 ppm Haze Resolution. - Accuracy within 1%. - XY coordinates. - Lock Down...
Cheonan-si, South Korea
SOLID STATE MEASRUEMENT INC. SSM2000
- used
- Manufacturer: SOLID STATE MEASRUEMENT INC.
System Measurement Performance Computer Subsystem Automated Features •;; Probe conditioning /•;; Probe calibration /•;; Sample alignment /•;; Unattended operation ( (NanoSRP™ Bevel Edge Alignment Tool ) Probing S...
Cheonan-si, South Korea
2004 SOLID STATE MEASRUEMENT INC. SSM 2000 Nano SRP
- used
- Manufacturer: SOLID STATE MEASRUEMENT INC.
System Measurement Performance Computer Subsystem Automated Features •; Probe conditioning /•; Probe calibration /•; Sample alignment /•; Unattended operation ( (NanoSRP™ Bevel Edge Alignment Tool ) Probing Subsy...
Cheonan-si, South Korea
1994 KLA TENCOR SFS 6200
- used
- Manufacturer: KLA-Tencor
- Model: Surfscan 6200
*.Configuration: - Non-patterned surface Inspection System. - 0.1 micron Defect Sensitivity (PSL STD). - 0.02 ppm Haze Sensitivity. - 0.002 ppm Haze Resolution. - Accuracy within 1%. - XY coordinates. - Lock Down...
Cheonan-si, South Korea
1998 SOLID STATE MEASRUEMENT INC. SSM150
- used
- Manufacturer: SOLID STATE MEASRUEMENT INC.
*. Measurement perfomance: - Resistivity and Dopant concentration - Resistance measurement & Carrier concentration profile analysis in all structures of silicon *. Measurement configuration: - Carrier concentrati...
Cheonan-si, South Korea
KLA TENCOR SFS 6220
- used
- Manufacturer: KLA-Tencor
To be refurbished. *. Configuration: - Non-patterned surface Inspection System. - 0.1 micron Defect Sensitivity (PSL STD). - 0.02 ppm Haze Sensitivity. - 0.002 ppm Haze Resolution. - Accuracy within 1%. - XY coor...
Cheonan-si, South Korea