Used parallel

IEC 60884-1 Clause 24.5 Figure 30, IEC 61386-1, IEC 60811-1-4 Low-Temperature Impact Test Device

• Manufacturer: Lisun

The DWC-1 Low-temperature Impact Device is according to IEC 60884-1 Clause 24.5 Figure 30 and Clause 30.5 Figure 42 (GB/T 2099.1 Clause 24.5 Figure 27 and Clause 30.5 Figure 42 ), IEC 61386-1 Clause 10.3 Figure 2...

DECCA DC-8504C

• Manufacturer: Decca

Product Application This machine used for sampling paper and paper board section of certain thickness for analysis of all fibers. It is a special sampling instrument necessary for the side pressure strength test ...

DECCA DC-DZ-101FC1

• Manufacturer: Decca

DECCA ASTM C273 Steel nickel-plated Sandwich Core Shear Testing Fixtures NFT 54-605 ISO1922 ASTM-C273 EN12090 Shear test fixture ASTM-C273 ASTM C394 ISO1922 shear test clamps fixture TH193-V4-Af138 Standard Shear...

IPD-SC1R Small Display

Small display for IPD IPD-SC1R -The minimum reading period is 1 sec, and up to 2048 reading values can be stored-Each display can store 2048 readings, and one value can be read in 1 msec cycle at the fastest. Aft...

DECCA DC-SGW-810

• Manufacturer: Decca

◆Using parallel lighting, hemisphere scattering, integrating sphere photoelectric receiving method ◆Using microcomputer automatic operating system and data processing system, can save up to 2000 sets of measureme...

High Quality Electronic Softness Tester for Hygiene Raw Materials 1-Year Warranty

• Manufacturer: WD

P arameter 1. Measuring range: 10~1000mN 2. Resolution power: 0.01mN 3. Display error: ± 1% (1mN below 20% of the upper limit) 4. Repeated error: <3% (below 20% of measurement upper limit allowed 1mN above the sp...

CMW100 communications manufacturing test set The radical new approach for ultimate smartphone production lines

• Manufacturer: R&S
• Model: CMW100

CMW100 communications manufacturing test set The radical new approach for ultimate smartphone production lines CMW100 communications manufacturing test set The radical new approach for ultimate smartphone product...

R&S FSWP Phase Noise Analyzer and VCD Tester

• Manufacturer: R&S

R&S FSWP Phase Noise Analyzer and VCD Tester Brief description The R&S FSWP phase noise analyzer and VCD tester features very high sensitivity thanks to extremely low noise internal sources and cross correlation....

Communications Manufacturing Test Set

• Manufacturer: Rohde & Schwarz

Product Description Continuous frequency range up to 6 GHz Multitechnology solution Parallel testing on up to eight RF ports High measurement performance High measurement accuracy Support of a wide range of metho...

Pin Gauge Set

• Manufacturer: Taiwan Nakazawa

This series is used to correct micrometer instrumental errors, spindle screw feed errors (example 1), and the parallelism and plane for each 1/4 rotation of spindles and anvils (example 2). The pin gauges have he...

SGW-810 Light Transmittance and Haze Tester Haze ASTM D1003

Application Use for test the light transmittance and haze degree of all transparent and semi-transparent parallel plane samples (plastic plate, sheets etc), and turbidity or clarity of liquid samples (water, drin...

Thread Gauge

• Manufacturer: Taiwan Nakazawa

The standard thread gauge consists of a set of thread ring gauges and thread plug gauges that are precisely matched with each other. Different from the limit gauge, the basic shape of the thread is correctly manu...

DECCA DC-SER-2000

• Manufacturer: Decca

High precision gear tooth surface profile roughness measurement High performance and cost-effective type Wide range inductance sensor for contour Roughness measurement without nosepiece High accuracy, small range...

DECCA DC-SP-1000

• Manufacturer: Decca

High precision surface profiler testing profilometer for industry machinery accessory profile measurement Standard type with reasonable price Digital profile detector Wide range profile measurement Various types ...

Decca DC-Vitral-7

• Manufacturer: Decca

Profilometer roughness measurement measuring machine instrument Measurement for once, high accuracy analysis for profile and roughness can be achieved. Once measured, roughness, waviness and contour can be analyz...