Used FEI Supporting Equipment (Semiconductors)

FEI Company 18572-H AVA Controller Module 18098 Used Working

• Manufacturer: FEI

FEI Company 18572-H AVA Controller Module 18098 Used Working Inventory # A-10129 This FEI Company 18572-H is used working surplus. The physical condition is good, but there are signs of previous use and handling....

2013 FEI Quanta 450 SEM

• Manufacturer: FEI

- 50/60 Hz - 230V - Full load: 8A With: - Edwards RV 8 - Edwards PV 25 MK - FEI SE R 580 Detector Currently installed and in use every day, great condition.

2009 FEI Helios Nanolab 400

• Manufacturer: FEI
• Model: HELIOS NANOLAB 400

Status of Equipment: Refurbished • Elstar FEG Electron column, 350v–30kV • In-lens SE and BSE detector and STEM • Elstar Electron column is capable of sub-nanometer STEM images • Sidewinder Ion column: 30kV ...

FEI Nova NanoSEM 450 SEM

• Manufacturer: FEI

Type: SEM Wafer Size: Equipment Configuration: - 1-30 kV (500 volts possible); 50 volts possible using beam deceleration - Immersion lens - NavCam (navigation camera) and infrared CCD camera - Plasma cleaner...

FEI NanoLab 1200 AT DualBeam FIB-SEM

• Manufacturer: FEI

- IXL120 Pump - (2) X-Max Detectors, 80 mm HASKRIS Chiller - Oxford INCA Integration Kit - Integrated plasma cleaner - Elstar Electron column - TLD In-Lens detector - Modes: SE, BSE - Tomahawk ion column ...

FEI Philips XL-30 Field Emission ESEM

• Manufacturer: FEI

Used

FEI Nova NanoSEM 230, with EDAX SDD EDS

• Manufacturer: FEI

The FEI Nova NanoSEM 230, D9376 is a scanning electron microscope (SEM) unit manufactured in Czechia. It includes a monitor/display for viewing and is intended for professional use in microscopy applications. Th...

2018 THERMOFISHER FEI Apreo C LoVac

• Manufacturer: FEI

Process Type: FA SEMs/TEMs/Dual Beams Date of Manufacture: 2018 Equipment Information: Apreo C LoVac FESEM with electrostatic final lens Resolution: 15kV – 1.0nm 1kV – 1.3nm 1kV (decel) 1.0nm Low Vacuum: ...

THERMOFISHER SCIENTIFIC / FEI / PHILLIPS Strata 400S

• Manufacturer: FEI
• Model: STRATA 400S

Dual Column, Focused Ion Beam (FIB) Strata 400 S (Stem) Multiple GIS Nano-micromanipulator for TEM specimen preparation The system has been well maintained and running tool has been under service contract sin...

THERMOFISHER SCIENTIFIC / FEI / PHILLIPS QUANTA 600 FEG

• Manufacturer: FEI
• Model: QUANTA 600 FEG

Detectors: SE, BSE, GSE, Chamber scope Stage: hot and cold (2) Scroll pumps

THERMOFISHER FEI SEM

• Manufacturer: FEI

FEI Helios 450S Dual Beam

• Manufacturer: FEI

FEI Helios Nanolab 450 Process Type: FA SEMs/TEMs/Dual Beams Status: Refurbished Specifications: Electron Source – TFE Elstar electron column with UC monochromator Ion Source – Tomahawk • Landing Voltage –...

2002 FEI Nova Nanolab 200 dual beam

• Manufacturer: FEI

Process Type: FA SEMs/TEMs/Dual Beams Date of Manufacture: 2002 Electron Column High-resolution Field Emission SEM Column Monopole magnetic immersion lens Schottky thermal field emitter 60-degree objective ...

FEI Machinery

• Manufacturer: FEI

FEI

FEI Inq

• Manufacturer: FEI

FEI Inq. Chiller