Used Test & Measurement (Semiconductors)

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KLA-Tencor AIT I Patterned Surface Defect Inspection System consisting
- Manufacturer: KLA-Tencor
- Model: AIT I
KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...
Decatur, GA
Trusted Seller
KLA-Tencor AIT I Patterned Surface Defect Inspection System
- Manufacturer: KLA-Tencor
- Model: AIT I
KLA-TENCOR AIT I PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT I Main System- KLA-Tencor AIT I Mainframe- Currently Configured for 6"/150mm & 8"/200mm Wafers- Double Darkfield Inspection ...
Decatur, GA
Trusted Seller
In-Circuit Test Systems Keysight 3070
- Manufacturer: Agilent - Keysight
- Model: 3070
Cary, NC
BAYER DIALOGLECK PROZESSOR DLP20 WATER INLET TESTER
- Manufacturer: BAYER
BAYER DIALOGLECK PROZESSOR DLP20 WATER INLET TESTER Bayer DLP20 Test & Measurement Equipment available in used condition. Ideal for professionals seeking reliable performance. Compact design ensures easy integrat...
$1,000 USD
Woodruff, SC
MINT CONDITION Gaertner Scientific Corp Multiwavelength Laser Ellipsometers LSE
- Manufacturer: Gaertner Scientific
“working pull” Shipping Note: Please send us an email to request rush same day shipping if it is an urgent breakdown. We ship worldwide and will on occasion require customers UPS/DHL/FEDEX account to ship to ove...
$3,850 USD
Niagara Falls, NY
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LTX 974-0248-00 Device Interface Board
1 in stock The LTX 974-0248-00 Device Interface Board is a specialized piece of equipment designed for use in semiconductor testing and assembly. Manufactured by LTX, this interface board allows for efficient com...
$1,200 USD
New York, USA
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HAMAMATSU E6136-01 / E613601 (NEW NO BOX) STOCK G924A
- Manufacturer: HAMAMATSU
HAMAMATSU E6136-01 / E613601 (NEW NO BOX) STOCK G924A
$25 USD
Montgomeryville, PA
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1TB SSD
- Manufacturer: Western Digital
High-capacity 1TB solid-state drive with SATA 6 Gb/s interface, optimized for NAS systems. Features a unique algorithm for balancing performance and reliability in NAS and RAID environments. Comes with a 5-year l...
Washington, DC
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Trusted Seller
National Instruments 779647-31
- Manufacturer: National Instruments
779647-31 | PXI-4130, -20 V to 20 V, 40 W, PXI Source Measure Unit
Cary, NC
Trusted Seller
Express Test
- Manufacturer: Express Test Corporation
Steam ager with digital controls, stainless steel construction
Billerica, MA
Trusted Seller
National Instruments 140185-01L
- Manufacturer: National Instruments
140185-01L | PXIe-4163, 24-Channel, High-Density PXI SMU
Cary, NC
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Agilent 4155B
- Manufacturer: Agilent - Keysight
- Model: 4155B
Semiconductor Parameter Analyzer The 4155B Semiconductor Parameter Analyzer is a stand-alone instrument capable of complete dc characterization of semiconductor devices and materials. It stimulates voltage and cu...
Cary, NC
Trusted Seller
Agilent 4155A
- Manufacturer: Agilent - Keysight
- Model: 4155A
Semiconductor Parameter Analyzer The 4155A Semiconductor Parameter Analyzer offers high-resolution/accuracy and a wide range. I: 1 fA to 100 mA (20 fA offset accuracy) V: 1 micro V to 100 V fully automated I-V sw...
Cary, NC
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Keysight (Agilent) 4155A
- Manufacturer: Agilent - Keysight
- Model: 4155A
Semiconductor Parameter Analyzer The 4155A Semiconductor Parameter Analyzer offers high-resolution/accuracy and a wide range; I: 10 fA to 100 mA (50 fA offset accuracy), V: 1 micro V to 100 V, fully automated I-V...
Cary, NC
Trusted Seller
Keysight (Agilent) 4145B
- Manufacturer: Agilent - Keysight
- Model: 4145B
Semiconductor Parameter Analyzer The 4145B Semiconductor Parameter Analyzer is able to offer complete dc characterization of semiconductor devices and materials. The 4145B stimulates voltage and current sensitive...
Cary, NC
CDE Resmap Test & Measurement (semiconductors)
- Manufacturer: CDE
- Model: Resmap
Good condition CDE Resmap Test & Measurement (semiconductors)s. Located in USA and other countries. Click request price for more information.
USA