Used Test & Measurement (Semiconductors) in Meath, Ireland

Nikon Optiphot 200D

• Manufacturer: Nikon
• Model: Optiphot 200

Microscope

Nikon Optiphot66

• Manufacturer: Nikon
• Model: Optiphot 66

Microscope

Rudolph Axi-S

• Manufacturer: Rudolph
• Model: AXI

Defect Inspection

Nikon Optiphot66

• Manufacturer: Nikon
• Model: Optiphot 66

Microscope

Nikon AMI-3000

• Manufacturer: Nikon
• Model: AMI-3000

AMI-3000 Nikon Macro-Defect Metrology Equipment

MINIENVIROMENT MONITOR (LARGE)

• Manufacturer: Particle Measuring Systems

MINIENVIROMENT MONITOR (LARGE)

MINIENVIROMENT MONITOR (SMALL)

• Manufacturer: Particle Measuring Systems

MINIENVIROMENT MONITOR (SMALL)

KLA 2132 Wafer Inspection System

• Manufacturer: KLA-Tencor

Serial number W21XX639 can be sold "as is" or operational to oem specs. Deinstalled by KLA, Warehoused, barrier bagged. The system was deinstalled in september 2002 and until that date was upgraded with various h...

KLA 1007E Wafer Prober

• Manufacturer: KLA-Tencor
• Model: 1007E

System Disk Recovery and Proactive Cloning

Our Partner has been specialising in data recovery from hard drives for almost 15 years throughout UK and Europe, They are launching a service for clients with computer-controller machinery that might be a single...

KLA AIT XP

• Manufacturer: KLA-Tencor
• Model: AIT XP

Single Loadport, 6” and 8” Wafer size: 6 & 8 inch

Shibuya EH162 SB TestHandler

• Manufacturer: Shibuya

CAD5309 5730 5450 0.8T

Shibuya EH520 TestHandler

• Manufacturer: Shibuya

CAD5308 5630 0.8T

ELECTROGLAS EG5/300E

• Manufacturer: Electroglas

ELECTROGLAS EG5/300E 300MM

TEL P-12XLM

• Manufacturer: Tokyo Electron - TEL
• Model: P-12XLM

TEL P-12XLM Wafer size: 300MM Process: ATE