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Hitachi SEM TrackBall Control Panel 585-5525 W/ Attached Control Boards
- Manufacturer: Hitachi
Hitachi SEM TrackBall Control Panel 585-5525 with Attached Control Boards. Unit is used and was pulled from a decommissioned Hitachi SEM. Not tested. See pictures, comes as shown Info on Boards: T.B. Cont P/N: 58...
$249 USDFayette, AL- Trusted Seller
JEOL JSM 7600 F SEM
- Manufacturer: Jeol
- Model: JSM
Resolution: - 1nm guaranteed at 15kV SEM mode - 2.5nm at 1kV in SEM mode - 1.5nm at 1kV in GB mode Magnification: - SEM: x100 (at WD 25mm) to x1,000,000 (at WD 8mm) - Low-Mag LM mode: x25 to x19,000 Imagin...
United States - Trusted Seller
Hitachi S 3000 N Scanning Electron Microscope (SEM)
- Manufacturer: Hitachi
- Model: S-3000N
- Variable Pressure (Low Vacuum) - 6" Stage - Windows XP Operating System - HP DC 7600 - Software Options: - Measurement - PCI Interface (Image management) - H.R. Image Memory - SEM Data Management - Ful...
United States - Trusted Seller
2009 FEI Nova NanoSEM 435 FEG-SEM
- Manufacturer: Amat
- Model: NanoSEM
Currently warehoused. Deinstalled by FEI Complete system. - Dual EDS - Spatial resolution: 3-4 nm under optimal conditions - Accelerating Voltages from 0.5 kV - 30 kV - Everhart Thornley Detector (for SE) ...
United States - Trusted Seller
1997 Hitachi S-4500 II Scanning Electron Microscope (SEM)
- Manufacturer: Hitachi
- Model: S-4500
- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guaranteed (at accelerating voltage 1 kV, working distance 3mm) Magnification: ...
United States - Trusted Seller
1997 Hitachi S-4500 II Scanning Electron Microscope (SEM)
- Manufacturer: Hitachi
- Model: S-4500
- Type II - EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guaranteed (at accelerating voltage 1 kV, working distance 3mm) Magnification: ...
United States 
New Cleveland Electric Tilting Skillet, Braising Pan 30 Gallon SEL-30-TR Commercial
New, never been used. This item comes from government auction. May contain scratches and dents. 208 volt With the Cleveland SEM-30-TR DuraPan electric modular base tilt skillet, you can cook up to 75 lb. of gro...
- Trusted Seller
HITACHI S-3400N SEM
- Manufacturer: Hitachi
- Model: S-3400
Hitachi S-3400N SEM The Hitachi S-3400N SEM is a high performance, user-friendly scanning electron microscope with new improvements that allow the best results for a wide range of applications. The tungsten SEM i...
Bree, Ireland - Trusted Seller
HITACHI S-7000 CD SEM
- Manufacturer: Hitachi
- Model: S-7000
CD SEM Measurement Tool - Wafer Size Range Minimum 100 mm Maximum 150 mm Set Size 150 mm - Resolution 150.00 Å - Acceleration Voltage Maximum Voltage 3 kV - Critical Dimension Measurement Range 0.10 µm - 200.0...
Trim, Ireland 
2009 FEI Nova NanoSEM 450
- Manufacturer: FEI
The FEI Nano Nova 430 FEG-SEM installed in 2009 is configured for high-resolution and analytical imaging of various materials. The instrument combines a field emission electron source, oil-free vacuum system, SE,...
Cleveland, OH- Trusted Seller
Jeol Scanning Electron Microscope (PC-SEM) JSM-6490 Bruker XFlash Detector
- Manufacturer: Jeol
Jeol Type: Jeol JSM-6490 Jeol scanning electron microscope Jeol JSM-6490 scanning electron microscope (PC-SEM) Modern, high-resolution, digital scanning electron microscope with newly developed electron optics an...
- Trusted Seller
2008 FEI Helios Nanolab 400
- Manufacturer: FEI
- Model: HELIOS NANOLAB 400
Process Type: FA SEMs/TEMs/Dual Beams Date of Manufacture: 2008 1. Operating system: Win XP 2002, SP3 2. User interface: FEI xT 3.8.10, 10-1-2013 3. SEM SFEG 4. FIB Sidewinder (21nA) 5. UHR stage, step prec...
United States - Trusted Seller
JEOL JWS-7555 scanning electron microscope
- Manufacturer: Jeol
JEOL JWS 7555 is a scanning electron microscope (SEM) that utilizes an advanced electron optical equipment, providing a high level of image performance. It is suitable for a wide range of applications, including ...
United States - Trusted Seller
1997 Hitachi S-4500 Type 11
- Manufacturer: Hitachi
- Model: S-4500
Scanning Electron Microscope (SEM) Wafer Size: Equipment Configuration: – Type II – EDX 1) Performance Resolution: - 1.5 nm guaranteed (at accelerating voltage 15 kV, working distance 4mm) - 4.0 nm guarant...
United States - Trusted Seller
FE SEM
- Manufacturer: Unknown
Tool status: Currently located in a lab powered up but due to be powered down and moved in mid March 2015. Includes the following: – One (1) PN# 595-9123 S-5200 FE-SEM Standard Specimen Holder (595-9742), Assorte...
Bree, Ireland
