- Trusted Seller
Rudolph Metapulse II 200-X
used
- Manufacturer: Rudolph
- Model: Metapulse 200
Rudolph MetaPULSE II 200 X Thickness Measurement System, s/n 200MP11-1608-AW-11. The MetaPULSE X Cu supports all aluminum interconnect processes and the silicides, ultra-thin barriers, and tungsten processes in a...
Grapevine, TX - Trusted Seller
KLA Tencor Alpha Step 200
used
- Manufacturer: KLA-Tencor
- Model: Alpha-Step 200
The Alpha-Step 200 is a measurement tool used to measure step heights, etch depths, coating thicknesses, micro-roughness and a variety of other high precision surface characteristics. Specifications Typically: Ve...
Grapevine, TX - Trusted SellerMagnolia, TX
- Trusted SellerMagnolia, TX
- Trusted SellerMagnolia, TX
- Trusted SellerMagnolia, TX
- Trusted SellerMagnolia, TX
- Trusted SellerMagnolia, TX
- Trusted SellerMagnolia, TX
- Trusted SellerMagnolia, TX
- Trusted SellerMagnolia, TX
- Trusted SellerMagnolia, TX
- Trusted SellerMagnolia, TX
- Trusted SellerMagnolia, TX
- Trusted SellerMagnolia, TX
Rudolph Metapulse 200 Metrology / Inspection (semiconductors)
used
- Manufacturer: Rudolph
- Model: Metapulse 200
Good condition Rudolph Metapulse 200 Metrology / Inspection (semiconductors)s available between 2003 and 2005 years. Located in USA and other countries. Click request price for more information.
USA
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