Used Test & Measurement (Semiconductors)

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KLA-Tencor AIT II Patterned Surface Defect Inspection System
- Manufacturer: KLA-Tencor
- Model: AIT II
KLA-TENCOR AIT II (200mm/300mm) PATTERNED SURFACE DEFECT INSPECTION SYSTEM consisting of: - Model: AIT II- Wafer Size: 200mm- 150/200mm Open Handler - Software Version 5.3.17.4- Double Darkfield Inspection Tool -...
Decatur, GA
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Rudolph / August NSX-95 Automated Defect Inspection
- Manufacturer: Rudolph
- Model: NSX-95
Rudolph / August NSX-95 Automated Defect Inspection consisting of: - Model: NSX-95- NSX Automated Wafer Handling System- WHS (Wafer Handler System) top plate- 4”/6”/8” Wafer Handler- Xandex 350-0002 Pneumatic Die...
Decatur, GA
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In-Circuit Test Systems Keysight 3070
- Manufacturer: Agilent - Keysight
- Model: 3070
Cary, NC
BAYER DIALOGLECK PROZESSOR DLP20 WATER INLET TESTER
- Manufacturer: BAYER
BAYER DIALOGLECK PROZESSOR DLP20 WATER INLET TESTER Bayer DLP20 Test & Measurement Equipment available in used condition. Ideal for professionals seeking reliable performance. Compact design ensures easy integrat...
$1,000 USD
Woodruff, SC
MINT CONDITION Gaertner Scientific Corp Multiwavelength Laser Ellipsometers LSE
- Manufacturer: Gaertner Scientific
“working pull” Shipping Note: Please send us an email to request rush same day shipping if it is an urgent breakdown. We ship worldwide and will on occasion require customers UPS/DHL/FEDEX account to ship to ove...
$3,850 USD
Niagara Falls, NY
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LTX 974-0248-00 Device Interface Board
1 in stock The LTX 974-0248-00 Device Interface Board is a specialized piece of equipment designed for use in semiconductor testing and assembly. Manufactured by LTX, this interface board allows for efficient com...
$1,200 USD
New York, USA
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HAMAMATSU E6136-01 / E613601 (NEW NO BOX) STOCK G924A
- Manufacturer: HAMAMATSU
HAMAMATSU E6136-01 / E613601 (NEW NO BOX) STOCK G924A
$25 USD
Montgomeryville, PA
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1TB SSD
- Manufacturer: Western Digital
High-capacity 1TB solid-state drive with SATA 6 Gb/s interface, optimized for NAS systems. Features a unique algorithm for balancing performance and reliability in NAS and RAID environments. Comes with a 5-year l...
Washington, DC
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National Instruments 779647-31
- Manufacturer: National Instruments
779647-31 | PXI-4130, -20 V to 20 V, 40 W, PXI Source Measure Unit
Cary, NC
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Express Test
- Manufacturer: Express Test Corporation
Steam ager with digital controls, stainless steel construction
Billerica, MA
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National Instruments 140185-01L
- Manufacturer: National Instruments
140185-01L | PXIe-4163, 24-Channel, High-Density PXI SMU
Cary, NC
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Keysight B1500A
- Manufacturer: Agilent - Keysight
- Model: B1500A
B1500A Semiconductor Device Parameter Analyzer / Semiconductor Characterization System Mainframe Keysight B1500A Semiconductor Device Parameter Analyzer is complete device characterization solution supporting ver...
Cary, NC
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Keysight 4145B
- Manufacturer: Agilent - Keysight
- Model: 4145B
Semiconductor Parameter Analyzer The 4145B Semiconductor Parameter Analyzer is a fully automatic, high-speed DC characterization of semiconductor devices. Sourcing and measurement 50 fA to 100 mA and 1 mV to 100 ...
Cary, NC
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Agilent 4145B
- Manufacturer: Agilent - Keysight
- Model: 4145B
Semiconductor Parameter Analyzer The 4145B Semiconductor Parameter Analyzer is a fully automatic, high-speed DC characterization of semiconductor devices. Sourcing and measurement 50 fA to 100 mA and 1 mV to 100 ...
Cary, NC
Trusted Seller
Agilent 4155B
- Manufacturer: Agilent - Keysight
- Model: 4155B
Semiconductor Parameter Analyzer The 4155B Semiconductor Parameter Analyzer is a stand-alone instrument capable of complete dc characterization of semiconductor devices and materials. It stimulates voltage and cu...
Cary, NC
CDE Resmap Test & Measurement (semiconductors)
- Manufacturer: CDE
- Model: Resmap
Good condition CDE Resmap Test & Measurement (semiconductors)s. Located in USA and other countries. Click request price for more information.
USA