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Used instruments in Mexico

  • Jeol JSM-6100 | Scanning Electron

    Jeol JSM-6100 | Scanning Electron Microscope (SEM)

    • used

    • Manufacturer: Jeol
    • Model: JSM

    For parts or not working “Unable to test, Selling for parts, Sold as is” TECHNICAL SPECIFICATIONS Brand: Jeol Model: JSM-6100 Device Type: Scanning Electron Microscope (SEM) Maximum Resolution: Up to 16 nm ...

    Tijuana, Mexico