Used Test & Measurement (Semiconductors)

Scientific Test 6010

• used

• Manufacturer: Scientific Test

Automatic Programmable per step Scanner for multiple device packages Includes one 4 device scanner board, 5 scanner board capability.

Scientific Test 6008

• used

• Manufacturer: Scientific Test

Scientific Test HC-500/HC-200

• used

• Manufacturer: Scientific Test

500 Amp High Current Deck On-state current tests such as VT, VF, VCESAT, VDSON and RDSON can be extended to the limits indicated above by use of the High Current Deck (pictured).

LEO 1455 Scanning Electron Microscope (SEM)

• used

• Manufacturer: LEO Electron Microscopy

LEO 1455 Scanning Electron Microscope Capable of handling a full 6in (150mm) wafer Tool unfortunately did not work well after receiving a software and PC upgrade. However, tool may work with some deeper investi...

Cascade Microtech Summit 12000 Prober 64525

• used

• Manufacturer: Cascade Microtech
• Model: Summit

Cascade Microtech Summit 12000 200mm Prober with Attoguard Microchamber and -65°C to 200°C Shielded Chuck. Cascade Microtech 12000 8 inch Semiautomatic Analytical Probe Station with MicroChamber™ that isolates an...

Cascade Microtech S300 64518

• used

• Manufacturer: Cascade Microtech

Cascade Microtech S300 semi-automatic and manual RF/Microwave Probing System for quick and reliable 300 mm on-wafer test and characterization. The S300 supports wafer sizes and shards from 0.5 in. (1 mm) all the ...

Cascade Microtech Summit 12000 64520

• used

• Manufacturer: Cascade Microtech
• Model: Summit

Cascade Microtech Summit 12000 200mm Prober with Attoguard Microchamber and -65°C to 200°C Shielded Chuck. Cascade Microtech 12000 8 inch Semiautomatic Analytical Probe Station with MicroChamber™ that isolates ...

Dage 4000 series ISA/PC12-UPGRADE 64977

• used

• Manufacturer: Nordson DAGE
• Model: 4000

Dage 4000 TPAXY Modular Wire Pull/Die Shear Bond Tester. Intuitive operating screens enable quick test set up and editing of parameters. Motorized stage allows for semiautomatic bond testing. Currently configured ...

Cascade Microtech Probe Card Holder 64522

• used

• Manufacturer: Cascade Microtech

Cascade Microtech Probe Card Holder. Probe card holder for the Summit and the S300 Cascade wafer probers.

Karl Suss Dark Box 64455

• used

• Manufacturer: SÜSS MicroTec

KARL SUSS Prober Dark Box Enclosure. Light tight enclosure for wafer probers. Cable ports on both sides of box. Easy lift front panel. Inside Dimensions: 38” L x 29” W x 40” H. Has several Scratches in panels. Do...

Tektronix 4200 Test & Measurement (semiconductors)

• used

• Manufacturer: Tektronix
• Model: 4200

Good condition Tektronix 4200 Test & Measurement (semiconductors)s. Located in USA and other countries. Click request price for more information.