- Trusted Seller
Zeiss/HSEB Axiospect 300 Automated Wafer Inspection and Review station for 200mm/300mm wafers
- Manufacturer: HSEB
Wafer inspection/review station for bare and patterned wafers Inspect 300mm wafers in FOUP loaders or 200mm wafers in open cassetes with adaptors 2 FOUP loaders Axiotron 300 microscope Equipe robot with PRE-5...
United States - Trusted Seller
Zeiss LM100
- Manufacturer: Zeiss
- Model: LM100
Zeiss LM100 Microscope Large Panel Inspection Tool Zeiss large panel inspection and CD (critical dimension measurement) tool with laser autofocus Merzhauser motorized xy stage with 550mm x 550mm travel (21.6"x2...
United States - Trusted Seller
KLA-Tencor Corp. Surfscan SP2.5+
- Manufacturer: KLA-Tencor
- Model: Surfscan SP2
Particle Measurement Metrology Equipment Currently Configured for: 300mm · Defect Inspection · Two Load Ports · SECS/GEM Capability · Integration to Klarity/UDB · Auto DSA · High resolution 3D imaging of ...
United States - Trusted Seller
2019 TSK UF3000 EX prober
- Manufacturer: Accretech - Tokyo Seimitsu - TSK
- Model: UF3000
De-Installed. It was in Working Condition. Wafer : 12 Inches. Vintage : 2019. It's complete with HDD and Software included. Configuration : - 12" Nickel Tri-Temp Chucktop - Tokyo Seimitsu Accretech ARTS-HS...
United States - Trusted Seller
RUDOLPH FE-VII-D, Focus Ellipsometer
- Manufacturer: Rudolph
RUDOLPH FE VII D is an ellipsometer designed for the characterization of thin films and surfaces. It uses both broadband and monochromatic illumination to measure the degree of polarization of back-reflected ligh...
United States - Trusted Seller
Nikon Optiphot 2 Microscope
- Manufacturer: Nikon
- Model: Optiphot 2
The microscope of the brand Nikon type Optiphot-2 is ideal for studying and viewing small objects that are not visible to the naked eye. Objectively
$3,557 USDApeldoorn, Netherlands 
Agilent 4156C Semiconductor Parameter Analyzer
- Manufacturer: Agilent - Keysight
- Model: 4156C
General features - Highly accurate laboratory bench top parameter analyzer for advanced device characterization - 4x High-resolution SMU, 2xVSU and 2xVMU - Fill-in-the blanks front panel operation - Measurement c...
Rudolph Research Auto EL III Ellipsometer
- Manufacturer: Rudolph
- Model: Auto EL-III
The Rudolph Ellipsometer AutoELIII allows measurement of the thickness and refractive index of one or two thin transparent films on a substrate. Features: Internal data reduction software for single and double la...
San Jose, CA
Rudolph Research FE-IIID Focus Dual Wavelength Ellipsometer
- Manufacturer: Rudolph
The FE III-D's advanced Focused Beam™ system uses dual wavelength technology to directly measure the sample with a small spot at multiple angles of incidence and at multiple wavelengths. This allows the system to...
San Jose, CA- Trusted Seller
Nordson Yestech YTV-FX
- Manufacturer: Nordson
For more information regarding stock and pricing, please click here. Nordson YESTECH YTV-FX in excellent condition. vintage 2011 Specifications: Defects Detected: Part: position, missing, wrong, polarity, skew, t...
Veenendaal, Netherlands - Trusted Seller
Keysight Technologies E5270B
- Manufacturer: Agilent - Keysight
- Model: E5270B
Precision Measurement Mainframe; Precision IV Analyzer / 8 Slot Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices with th...
Los Angeles, CA - Trusted Seller
Keysight Technologies E5270B
- Manufacturer: Agilent - Keysight
- Model: E5270B
Precision Measurement Mainframe; Precision IV Analyzer / 8 Slot Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices with th...
Harrow, United Kingdom 
KLA-Tencor Surfscan 6420 Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 6420
KLA-Tencor Surfscan 6420 Inspection System, a surface inspection tool for unpatterned wafers. It accommodates wafer sizes: 100, 125, 150, and 200mm (round or rectangular substrates). The 6420 is a film surface an...
San Jose, CA
KLA-Tencor SP1-TBI Unpatterned Surface Inspection System
- Manufacturer: KLA-Tencor
- Model: SP1
KLA-Tencor's SP1 configured with KLA-Tencor's Trible-Beam Illumination (TBI). Specifications: Dual Dark Field Collection Channels. Sensitivity 60nm / 0.060µm. 0.001 ppm Haze Sensitivity. Argon Ion Laser (488nm. I...
San Jose, CA
KLA-Tencor SP1 Classic with single 200mm open cassette or single 300mm foup
- Manufacturer: KLA-Tencor
- Model: SP1
300/200mm wafers Dual Dark Field Collection Channels 0.079um Defect Sensitivity 0.001 ppm Haze Sensitivity Argon Ion Laser (488nm) Measurement Chamber with ULPA Filter and Blower Unit Operator Interface : MS Wind...
San Jose, CA
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