- Trusted Seller
2001 HITACHI S-9220
- Manufacturer: Hitachi
- Model: S-9220
The tool is complete with no known issues OEM Model Description The Hitachi S-9220 CD-SEM is a high-resolution, automated tool for precise CD measurements. It is designed for inline process control and developm...
United States - Trusted Seller
Chromasens WBI_Scanmodul COB Wafer Stage CP 0005 KPA-Tencor 0319954-000 Cu Spare
- Manufacturer: KLA-Tencor
“Removed from a KLA-Tencor 1102061815000 WBI 300 (COB) Module 300mm System” Chromasens WBI_Scanmodul COB Wafer Stage CP 0005 KPA-Tencor 0319954-000 Cu Spare Copper Cu Exposed Removed from a KLA-Tencor 11020618150...
$1,007 USDAlbuquerque, NM - Trusted Seller
KLA-Tencor 0597627-004 Thickness Gage Controller WSTG-KT089-1 WaferSight 1 Spare
- Manufacturer: KLA-Tencor
KLA-Tencor 0597627-004 Thickness Gage Controller WSTG-KT089-1 WaferSight 1 Spare Model No: WSTG-KT089-1 Removed from a KLA-Tencor 300mm WaferSight 1 Optical Inspection System Installed Components Part No: 4810 (Q...
$2,004 USDAlbuquerque, NM - Trusted Seller
1999 Leica IN3000
- Manufacturer: Leica
Wafer Sizes: 8"/200mm Wafer defect inspection The Leica INS 3000 is the new defect review and inspection station. The all stainless-steel system features a fully automatic integrated microscope, including UV and...
United States - Trusted Seller
HITACHI S-3400N Scanning Electron Microscope
- Manufacturer: Hitachi
- Model: S-3400N
The Hitachi S-3400N Variable Pressure SEM has been developed by improving the design of the S-3000N VP SEM which has been well accepted in the world market. It allows the study of wet, oily and/or non-conductive ...
United States KLA Tencor MicroXAM-800 3D Benchtop Optical Wafer Surface Profiler Profilometer
- Manufacturer: KLA-Tencor
“The MicroXAM-800 is a white light interferometer-based optical profiler that measures nanometer-level features with phase scanning interferometry (PSI), and sub-micron to millimeter features with vertical scanni...
Sparks, NV- Trusted Seller
2011 KLA Puma 9550 i Defect Inspection
- Manufacturer: KLA-Tencor
KLA Puma 9550 i Defect Inspection, 12" - 3 Phase - 5 Wire - 208 V - 16 amps - 50/60 Hz - 300mm Dual Films Handler w/Integrated Mini Environment DP sensor - Two Front Interface Mechanical Standard (DFIMS) L...
United States - Trusted Seller
Automated Thickness Measurement System
- Manufacturer: Unknown
Status: Tool is shut down. Original PO info. Sigmatech UltraMapS2H-200FP……… Sigmatech 9600L Loading/Unloading Module….. Stage Adaptor Fixture w/edge ring 4″….. Stage Adaptor Fixture w/edge ring 6″……….. Stage Adap...
Bree, Ireland 
Semilab CMS3 non contact sheet resistance measuring system
- Manufacturer: Semilab
CMS, CLS FAST NON-CONTACT MATERIAL CHARACTERIZATION AND PROCESS CONTROL Emitter sheet resistance is a primary quality control parameter for silicon wafers in PV applications after emitter diffusion. The CLS mo...
- Trusted Seller
MINARIK AUTOMATION AND CONTROLS PCM4
- Manufacturer: Minarik
Bree, Ireland - Trusted Seller
Nanometrics Automated Film Thickness Measurement System
- Manufacturer: Nanometrics
Nanometrics Automated Film Thickness Measurement System Automated Film Thickness Measurement System
Bree, Ireland - Trusted SellerTrim, Ireland
- Trusted Seller
KLA-Tencor FLX-5200 Automated Thin Films Measurement System
- Manufacturer: KLA-Tencor
KLA-Tencor FLX-5200 Automated Thin Films Measurement System
Bree, Ireland - Trusted Seller
KLA-Tencor Archer 10 Overlay Registration Measurement System
- Manufacturer: KLA-Tencor
KLA-TENCOR ARCHER 10 AUTOMATED MISREGISTRATION SYSTEM consisting of: Fully automated overlay measurement module including coherence probe interference microscope and automated wafer handling- 200mm dual open.- K...
Decatur, GA 
N&K 1512 Thin Film Measuring System
N&K 1512 Ultra-High Sensitivity Thin Film Measurement System Includes Calibration base wafer The n&k 1500 utilizes raw Reflectance (R) data to determine the optical properties (n and k) and thicknesses of thin...
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