New Metrology / Inspection (Semiconductors) in China

CS8620 CS8630 CS8420 Camera

• Manufacturer: Yinuo

T1004A20A TI004A20A T1000-05A TI000-05A grating ruler reading head

• Manufacturer: Yinuo

AM03-015218A DSJ-F8-0005 J91851018A Fixed Camera

• Manufacturer: Yinuo

V-CUT thickness meter

• Manufacturer: Minder Hightech

V-CUT residual thickness gauge Economical, convenient and durable Easy to operate and use High accuracy Convenient adjustment Good stability 1. The machine should be placed on a level ground to ensure its stabili...

Hitachi S-3400N Scanning Electron Microscope

• Manufacturer: Hitachi
• Model: S-3400N

Hitachi Model S-3400N Scanning Electron Microscope with TMP molecular pump vacuum system saves floor space and power supply power consumption. It is mainly used for the effective analysis of the microscopic morph...

Hitachi High-Tech Field Emission Scanning Electron Microscope SU8220

• Manufacturer: Hitachi
• Model: SU8220

The existing models SU8240, SU8230, SU8220 and SU8010 have been re-integrated to form the Regulus8240, Regulus8230, Regulus8220, and Regulus8100. The Regulus series inherits the observation and analysis performan...

NCS multifunctional mechanical performance micro-magnetic nondestructive testing instrument

• Manufacturer: NCS

Origin: Beijing, China

NCS CS3500 carbon-sulfur analyzer

• Manufacturer: NCS

Origin: Jiangsu | -channel configuration: Standard three independent infrared absorption channels, according to customer demand can increase the high sulfur channel, can be configured with four independent infra...

Front and rear fine adjustment mechanism 0.001mm/grid

Front and rear fine adjustment mechanism 0.001mm/grid Semiconductor industry, electronic connector industry, ceramic industry, tungsten steel industry, precision and high precision parts processing industry, prec...