Burn-in testers are specialized systems that stress semiconductor devices under controlled temperature, voltage and load to reveal early-life failures and verify long-term reliability. Used in production and reliability labs, they combine thermal chambers, power supplies, device sockets or carrier boards, and test sequencing software to run extended soak and dynamic tests at high throughput.
Check supported device types (DUT pin count and package), temperature range, power/channel specs, throughput (slots/chamber capacity), availability of load boards and test recipes, control software/version, calibration history, spare-parts availability, and any modifications. Verify maintenance records and run a demo with your device types if possible.
Use a carrier experienced with semiconductor test equipment. Power down, drain fluids if any, secure movable parts, remove fragile load boards and sockets, crate the chamber with shock mounts, climate-control if long transit, insure the shipment, and include handling and setup instructions.
Regularly calibrate temperature sensors and power supplies (typically annually), replace worn sockets/contacts and relay modules, clean or replace chamber filters and fans, verify thermal seals, update firmware/software, and keep logs of repairs and preventive checks to maintain reliability and throughput.