Used Test & Measurement (Semiconductors) in South Korea

Customized BBT System for Package Substrate PCB

• Manufacturer: BiOptro

Enhanced Test Speed and Alignment Accuracy. Tension Work Table (Servo Type) applicable to Thin PCB (0.08t). Testing with Top 8K / Bottom 8K points (Option : Max 32K). Special Test Function (Micro-Short, Spark, 4-...

Customized BBT System for Flexible PCB

• Manufacturer: BiOptro

Enhanced Test Speed and Alignment Accuracy. (Two times better than those of BFPS-550) Testing with Top 2K & Bottom 2K points (Option: Max 32K) Applicable to Multi-Arrayed Large PCB (450 x 500size) with Fine-Pitch...

Customized BBT System for HDI PCB

• Manufacturer: BiOptro

High Speed Index Table (Testing of 250x320mm). Testing with Top 8K & Bottom 8K points (Max : 16K + 16K). Special Test Function (4-Wire, Micro-Short, HR-Short, Spark). High-Precision Positioning (Overall Aligning ...

2005 NANOMETRICS Nanospec 6100

• Manufacturer: Nanometrics
• Model: Nanospec 6100

•; Linear array head •; Small spot size •; Fast focus •; Fast measurements •; Broad thickness ranges •; Multipurpose thin and thick film capability •; Continuous scanning from 210–;800 nanometers •; Optional UV c...

MKS, P99A-28229, Pressure Controller

• Manufacturer: MKS

Gas N2, Range 1000SCCM, 1000Torr - VINTAGE: Unknown - CONDITION: As-is

Customized BBT System for FC-BGA Quad type PCB

• Manufacturer: BiOptro

Enhanced Test Speed and Alignment Accuracy. Tension Work Table (Servo Type) applicable to Thin PCB (0.08t). Testing with Top 8K / Bottom 8K points (Option : Max 32K). Special Test Function (Micro-Short, Spark, 4-...

1994 KLA TENCOR SFS 6200

• Manufacturer: KLA-Tencor
• Model: Surfscan 6200

*.Configuration: - Non-patterned surface Inspection System. - 0.1 micron Defect Sensitivity (PSL STD). - 0.02 ppm Haze Sensitivity. - 0.002 ppm Haze Resolution. - Accuracy within 1%. - XY coordinates. - Lock Down...

NIKON Nikon Eclips L200 + NWL641

• Manufacturer: Nikon
• Model: NWL641

Nikon Eclips L200 - Motorize objectives Nikon NWL641 autoloader - Orientation flat/notch detection

2000 KLA TENCOR AIT AIT XP+(Fusion)

• Manufacturer: KLA-Tencor
• Model: AIT XP

[ System Configuration ] . CE marked . Single open cssette handler . Image Computer . (3) Collection Channels . Spot Size 7um, 5um, 3.5um . Internal Microscope Review - Microscope review Objectives 10x, 50x, 100x...

1996 VEECO Dimension 7000

• Manufacturer: Veeco - Sloan
• Model: Dimension 7000

As-Is, 8" Automatic AFM tool Wafer size: 8" | Sell status: SELL | Tool's condition: AS-IS

1996 Nanometrics Nanospec8000

• Manufacturer: Nanometrics
• Model: Nanospec

5. Wafer Size : Process: MET | Shipping: EXW

2011 HMI eScan 400

• Manufacturer: HMI
• Model: Escan 400

Wafer size: 12" | Process: E-Beam Defect Inspection | Shipping: EXW

2007 KOCUSAI VR120_SD

• Manufacturer: KOCUSAI

Wafer size: 12" | Process: Resistivity Test System | Shipping: EXW

RUDOLPH B20

• Manufacturer: Rudolph

HITACHI S-8820

• Manufacturer: Hitachi
• Model: S-8820

Vintage : 0000 Process : SEM Scanning Electron Microscope Maker : HITACHI Model : S-8820 Condition : Used

KLA-Tencor Surfscan 6100 Test & Measurement (semiconductors)

• Manufacturer: KLA-Tencor
• Model: Surfscan 6100

Good condition KLA-Tencor Surfscan 6100 Test & Measurement (semiconductors)s. Located in South Korea and other countries. Click request price for more information.