Used Test & Measurement (Semiconductors) in South Korea

2007 RUDOLPH MP300

• Manufacturer: Rudolph
• Model: MP 300

Wafer size: 12

2002 Advantest M6541AD

• Manufacturer: Advantest
• Model: M6541AD

Handler

1980 test test

• Manufacturer: test

Process: test | Size(mm): 100mm

2003 MOSAID MS-4205

• Manufacturer: Mosaid

Process: TEST | Size(mm): 200mm

MICROMANIPULATOR MM8065 (PROBE)

• Manufacturer: Micromanipulator
• Model: MM8065

Process: METROLOGY | Size(mm): 200mm

1999 PLASMOS, SD2002, ELLIPSOMETER

• Manufacturer: Plasmos

Wafer 300mm - CONDITION: As-is Equipment detail: ELLIPSOMETER | Description: Wafer 300mm | Video monitor: 9M200A | Electrophysics: AF-750 Microscope Autofocus System

2010 AIT, AVIS-5000N, LED Wafer Inspection System

• Manufacturer: AIT

Wafer 2~6" - CONDITION: As-is Equipment detail: LED Wafer Inspection System | Description: Wafer 2~6"

2005 MOSAID MS-4205

• Manufacturer: Mosaid

Process: TEST | Size(mm): 200mm

2001 MOSAID MS-4205

• Manufacturer: Mosaid

Process: TEST | Size(mm): 200mm

2003 NIKON, OPTIPHOT-300D, Inspection Microscope

• Manufacturer: Nikon
• Model: Optiphot 300

14x10 Stage, Wafer 12", 100-120V, 3A, 50/60Hz - CONDITION: As-is

2017 AOI

• Manufacturer: Orbotech-KLA

2012 KOH YOUNG, KY-7100, 3D Automatic Optical Inspection Machine

• Manufacturer: Koh Young
• Model: KY7100

208VAC, 1Phase, 50/60Hz - CONDITION: Working/Deinstall, As-is

Curve Tracer / TEK 370A

• Manufacturer: Tektronix
• Model: 370A

Curve Tracer

Customized BBT System for HDI PCB

• Manufacturer: BiOptro

High Speed Index Table (Testing of 250x320mm). Testing with Top 8K & Bottom 8K points (Max : 16K + 16K). Special Test Function (4-Wire, Micro-Short, HR-Short, Spark). High-Precision Positioning (Overall Aligning ...

Customized BBT System for Package Substrate PCB

• Manufacturer: BiOptro

Enhanced Test Speed and Alignment Accuracy. Tension Work Table (Servo Type) applicable to Thin PCB (0.08t). Testing with Top 8K / Bottom 8K points (Option : Max 32K). Special Test Function (Micro-Short, Spark, 4-...

KLA-Tencor AIT XP Test & Measurement (semiconductors)

• Manufacturer: KLA-Tencor
• Model: AIT XP

Good condition KLA-Tencor AIT XP Test & Measurement (semiconductors)s manufactured in 2003. Located in Ireland and other countries. Click request price for more information.