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Used wafer processing

  • Trusted Seller
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    TEL P-12XLM

    • used

    • Manufacturer: Tokyo Electron - TEL
    • Model: P-12XLM

    TEL P-12XLM Wafer size: 300MM Process: ATE

    Trim, Ireland
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    MICROMANIPULATOR PROBE STATION 1

    • used

    • Manufacturer: Micromanipulator

    MICROMANIPULATOR PROBE STATION 1 Wafer size: 200mm Process: ATE

    Trim, Ireland
  • 2010 Automated Measurement System EVG40NT

    2010 Automated Measurement System EVG40NT

    • used

    • Manufacturer: EVG GROUP

    The EVG40 NT (stand-alone tool) and the AVM (HVM-integrated module) enable measurement of lithography-relevant parameters like critical dimensions, as well as bond alignment accuracy. Because of the system’s high...

    Wu Xi Shi, China
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    1985 KLA SURFSCAN 6220

    1985 KLA SURFSCAN 6220

    • used

    • Manufacturer: KLA-Tencor
    • Model: Surfscan 6220

    Wafer Size 200 mm Fab Section Metrology Tool Status Running Wafers Asset Description PCT0009(SMP-CTECH) Software Version WIN95 CIM GEM Process DO MEASUREMENT Options System NA OK Others LPT 1 OK Main Sys...

    Asia
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    Pilot V8 HR flying needle

    Pilot V8 HR flying needle online measurement vertical double-sided 8-pin

    • new

    Guckless technology for challenging probe cards Wafer fabrication is a step-by-step process that gradually forms electronic circuits. By way of simplification, during the fabrication of a silicon wafer, some inte...

    Shenzhen, China
  • 193 Blue Film AOI

    193 Blue Film AOI

    • new

    Blue Film AOI Blue Film AOI is a kind of automatic optical inspection equipment for detecting defects on the surface of semiconductor wafers. It can be used in conjunction with optical positioning devices and cha...

    Zhubei City, Hsinchu County, Taiwan 302
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    Agilent (HP) 4156C Semiconductor Parameter

    Agilent (HP) 4156C Semiconductor Parameter Analyzer

    • used

    • Manufacturer: Agilent - Keysight
    • Model: 4156C

    The Keysight / Agilent 4156C Precision Semiconductor Parameter Analyzer provides highly accurate laboratory benchtop parameter analyzers for advanced device characterization. The superior low-current and low-volt...

    Shenzhen, China
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    2008 AMAT Uvision 600SP

    • used

    • Manufacturer: Amat
    • Model: Uvision

    Process: Metrology Wafer size: 300mm

    Asia
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    2009 Rudolph MP3 300XCu

    • used

    • Manufacturer: Rudolph
    • Model: MP 300

    Process: Thickness Measurement Wafer size: 12" Condition: as is

    Asia
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    ADVANTEST T5382A1

    • used

    • Manufacturer: Advantest
    • Model: T5382A1

    ADVANTEST T5382A1 Wafer size: 200mm Process: ATE

    Asia
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    ADVANTEST M6751AD

    • used

    • Manufacturer: Advantest
    • Model: M6751AD

    ADVANTEST M6751AD Wafer size: 200mm Process: ATE

    Asia
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    2004 Rudolph AXI-S

    • used

    • Manufacturer: Rudolph
    • Model: AXI

    Process: Macro Defect Inspection Condition: as is Wafer size: 12"

    Asia
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    Nikon OPTIPHOT 300

    • used

    • Manufacturer: Nikon
    • Model: Optiphot 300

    Process: microscope Condition: complete (1) as is (1) Wafer size: 12"

    Asia
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    2012 TEL Precio Nano

    • used

    • Manufacturer: Tokyo Electron - TEL
    • Model: Precio

    Wafer size: 300mm Process: test - Chuck Type : Air-Cool - Chuck Surfave : Gold - Docked Tester : IP750EX - OCR : Yes - FFU : Yes

    Asia
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    2003 TSK UF-200

    • used

    • Manufacturer: Accretech - Tokyo Seimitsu - TSK
    • Model: UF200

    Vintage: 2001 (1) 2002 (1) 2003 (2) Wafer size: 8" Configuration overview: frame Process overview: Prober Tool status: running

    Asia
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