N&K N&K 1700
used
- Manufacturer: N&K
*. Film Thickness and Trench profile measurement. *. Manual load Metrology system. *. Simultaneously determine thickness, n and k in the spectral range of 190-1000nm, trench profile and provide non-destructive, r...
Cheonan-si, South Korea
1996 NANOMETRICS 2100
used
- Manufacturer: Nanometrics
- silicon dioxide on silicon 400~ 30,000 A. - photo resist on silicon 500~ 40,000 A. - other thin films. *. Hardware configuration: - Optical microscope & objectives 5x,10x,40x. - Spectrophotometer Head. - Microc...
Cheonan-si, South Korea
1995 KLA TENCOR P-10
used
- Manufacturer: KLA-Tencor
- Model: P-10
- Standard Head with L(yellow) type stylus. - Intel Pentium 233Mhz Ram:32MB , HDD: 2GB - Installed in Clean-room.
Cheonan-si, South Korea
KLA TENCOR P-2
used
- Manufacturer: KLA-Tencor
- Model: P-2
- Long Scan Profiler Measurement. - Standard Head with L type stylus. - 486DX PC & LCD Color Monitor, MS-DOS 6.22. - Anti-bivration table. - Installed in Clean-room. - Fully refurbished. - Can demonstrate any time.
Cheonan-si, South Korea
2001 NIKON NWL641M
used
- Manufacturer: Nikon
- Model: NWL641
IC Inspection Wafer Loader Orientation flat/notch detection
Cheonan-si, South Korea
APPLIED MATERIALS AMC 7700
used
- Manufacturer: Amat
*. Operational at the time of de-installation,To be refurbished *. Wafer Size - 100mm(4") ~ 150mm(6") *. Reactor system configuration: - Staubli Robot - Lift & Roation Assembly - Process chamber Assembly - Lower ...
Cheonan-si, South Korea
1997 LEO/KOBELCO LTA-700
used
- Manufacturer: Kobelco
Variiable Injection Type Wafer Lifetime Measuring System.
Cheonan-si, South Korea
HITACHI S-5500
used
- Manufacturer: Hitachi
- Model: S-5500
In-lens Field Emission Scanning Electron Microscope. Imgae Resolution : - 0.4nm guaranteed at accelerating voltage 30kV - 1.6nm guaranteed at accelerating voltage 1kV Magnification : - LM Mode 60X~100,0000X - H...
Cheonan-si, South Korea
2000 KLA TENCOR VIPER 2410
used
- Manufacturer: KLA-Tencor
- Model: Viper 2410
KLA-Tencor's 2401 Automated Macro Defect Inspection System - Replacing the manual bright light macro defect inspection performed by operators. - Automated detection, classification and reporting of all yield- cri...
Cheonan-si, South Korea
1998 KLA TENCOR HRP100
used
- Manufacturer: KLA-Tencor
*. To be refurbished *. Installed in Clean-room. Wafer size: 8" | Sell status: SELL | Tool's condition: AS-IS
Cheonan-si, South Korea
2011 KLA TENCOR Candela 8600
used
- Manufacturer: KLA-Tencor
- Model: Candela 8600
KLA-Tencor Candela 8600 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is manual wafer handling tool. The Candela defect detection system simulta...
Cheonan-si, South Korea
2011 KLA TENCOR Candela 8620
used
- Manufacturer: KLA-Tencor
- Model: Candela 8620
KLA-Tencor Candela 8620 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is fully automated with integrated wafer handling for cassette-to-cassette...
Cheonan-si, South Korea
1993 KLA TENCOR FLX2320
used
- Manufacturer: KLA-Tencor
- Model: FLX-2320
*.Measurement *.Utility *.Intalled in a clean room and can demonstrate any time.
Cheonan-si, South Korea
2009 KLA TENCOR CS10V
used
- Manufacturer: KLA-Tencor
- Model: CS10V
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Opaque substrates - EPI Layers - Transparent film coatings (S...
Cheonan-si, South Korea
2006 KLA TENCOR CS20
used
- Manufacturer: KLA-Tencor
- Model: CS20
[ General Description ] [ Performance ] Defect Sensitivity 0.08 μm diameter PSL sphere equivalent > 95% capture rate(PSL on bare Si) [ Application ] - Opaque substrates - EPI Layers - Transparent film coatings (S...
Cheonan-si, South Korea
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