- Trusted Seller
ADE 6033 Wafer Tester
used
- Manufacturer: ADE
WAFER TESTER FOR WAFER THICKNESS INCLUDES LARGE ANVIL STYLE TABLE TO HOLD SMALL OR LARGE SUBSTRATES
Billerica, MA 353 ROBOT / ADE TECHNOLOGIES INC 022256-02 / ADE
used
- Manufacturer: ADE
“SOLD AS IS, WHERE IS ***NO WARRANTY*** THIS ITEM MUST BE SHIPPED FREIGHT. NOTE THAT IT IS THE BUYER’S RESPONSIBILITY FOR CRATE COST AS WELL AS SHIPPING EXPENSES.”
353 ROBOT /ADE TECHNOLOGIES INC 022256-02 /ADE
used
- Manufacturer: ADE
““SOLD AS IS WHERE IS ***NO WARRANTY*** THIS ITEM MUST BE SHIPPED FREIGHT. NOTE THAT IT IS THE BUYER’S RESPONSIBILITY FOR CRATE COST AS WELL AS SHIPPING EXPENSES.””
353-15 / ROBOT ASSY INC022256-02 / ADE
used
- Manufacturer: ADE
“SOLD AS IS WHERE IS ***NO WARRANTY*** THIS ITEM MUST BE SHIPPED FREIGHT. NOTE THAT IT IS THE BUYER’S RESPONSIBILITY FOR CRATE COST AS WELL AS SHIPPING EXPENSES.””
031457-01 / PCB BOARD HIGH VOLTAGE / ADE
used
- Manufacturer: ADE
“SOLD AS IS WHERE IS ***NO WARRANTY***” Mpn: 031457-01
022705091 REV / VACUUM/INTERFACE BOARD, 022705-01 / ADE
used
- Manufacturer: ADE
“SOLD AS IS WHERE IS ***NO WARRANTY***” Mpn: 022705091 REV
$2,500 USDBuda, TX- Trusted Seller
ADE 6033T Thickness Gauges
used
- Manufacturer: ADE
ADE 6033T Thickness Gauges (ADE Microsense 6033T) MicroSense 6033T * The Model 6033T,using ADE's patented capacitive measurement principle, measures wafers for Thickness and Total Thickness Variation (T...
Rocklin, CA - Trusted Seller
ADE 6034 Thickness Gauges
used
- Manufacturer: ADE
ADE 6034 Thickness Gauges (ADE /Microsense 6034) ADE / Microsense model 6034* Measures: Wafer thickness total, Thickness variation (TTV), Flatness, bow and warp.* Non-contact* Accurate* Digital display* Wid...
Rocklin, CA ADE UltraScan 9300 Wafer Inspection System
used
- Manufacturer: ADE
Non-contact capacitive probe measurement with 10nm resolution, and 400 to 1000 microns wafer thickness range. It is capable of handling 100mm to 200mm wafers. Features: 2 cassette input stations 3 cassette output...
San Jose, CAADE UltraScan 9350 Wafer Inspection / Sorter System
used
- Manufacturer: ADE
Non-contact capacitive probe measurement with 10nm resolution, 400 to 1000 microns wafer thickness range. Capable of handling 100mm to 200mm wafers Features: 2 cassette input stations, 3 cassette output stations,...
San Jose, CA022256-04 / ASSY 353 ROBOTIC ARM 2 CAST / ADE
used
- Manufacturer: ADE
““SOLD AS IS WHERE IS ***NO WARRANTY***”THIS ITEM MUST BE SHIPPED FREIGHT. NOTE THAT IT IS THE BUYER’S RESPONSIBILITY FOR CRATE COST AS WELL AS SHIPPING EXPENSES.””
- Trusted Seller
ADE Episcan 1000 FT-IR
used
- Manufacturer: ADE
- Model: EPISCAN 1000
Measurement of Epi Films <25µ ON-LINE TECHNOLOGIES 2110 Spectrometer Head IRVINE OPTICAL Nanoloader II Dual Cassette Wafer Handler ADE ACS Controller Windows NT Operating System Wafer Mapping Scanning Stage casse...
Trim, Ireland - Trusted Seller
ADE Phase Shift MicroXAM Optical interferometric profiler
used
- Manufacturer: ADE
Trim, Ireland - Trusted Seller
ADE 6033 Thickness Gauge
used
- Manufacturer: ADE
ADE 6033 Thickness Gauge (ADE Microsense 6033) ADE 6033 Thickness Gauge* The Model 6033 measures wafers for Thickness* Whenever semiconductor wafer inspection is required, the MicroSense Model 6033 offers...
Rocklin, CA - Trusted Seller
ADE 6035 Resistivity Gauges
used
- Manufacturer: ADE
ADE 6035 Resistivity Gauges (ADE Microsense 6035) ADE MicroSense model 6035* Model 6035 uses non-contact eddy-current probes to accurately measure Bulk Resistivity of wafers. * This M...
Rocklin, CA