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Used robots

  • ADE UltraScan 9300 Wafer Inspection

    ADE UltraScan 9300 Wafer Inspection System

    • used

    • Manufacturer: ADE

    Non-contact capacitive probe measurement with 10nm resolution, and 400 to 1000 microns wafer thickness range. It is capable of handling 100mm to 200mm wafers. Features: 2 cassette input stations 3 cassette output...

    San Jose, CA
  • ADE UltraScan 9350 Wafer Inspection

    ADE UltraScan 9350 Wafer Inspection / Sorter System

    • used

    • Manufacturer: ADE

    Non-contact capacitive probe measurement with 10nm resolution, 400 to 1000 microns wafer thickness range. Capable of handling 100mm to 200mm wafers Features: 2 cassette input stations, 3 cassette output stations,...

    San Jose, CA