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Ultracision Polar III T7
- Manufacturer: Polar
Ultracision Polar III T/7 Ultracision Polar III T/7 CV Mercury Probe
Bree, Ireland KLA-Tencor Surfscan 7700 Wafer Inspection System
- Manufacturer: KLA-Tencor
- Model: Surfscan 7700
A patterned and unpatterned wafer inspection and can accommodate wafers between 4" to 8". Features: High sensitivity on after-ech and high topography applications Dual collection channels Circular input polarizat...
San Jose, CA- Trusted Seller
Nordson Yestech FX-940 3D AOI System
- Manufacturer: Nordson
- Model: FX-940
Nordson Yestech FX-940 3D AOI System Automated Optical Inspection System DOM: 12/2015 3D Inspection Proprietary megapixel color imaging Capture on the fly technology 1 top-down and 4 side angle cameras Qui...
Arizona, USA Nikon Optiphot-POL
- Manufacturer: Nikon
- Model: Optiphot
Includes: Nikon Optiphot POL Polarizing Trinocular Microscope Leitz Wetzlar Pl Fl 4/0.14 Nikon 231611 Plan 40 DIC 0.65 160/0.17 2x CFW10X Eyepieces Power Cord This item is fully tested and in excellent working or...
$1,658 USDRancho Cordova, CANikon Optiphot 150 Inspection Microscope for brightfield, darkfield, and DIC
- Manufacturer: Nikon
- Model: Optiphot 150
Reflected light microscope configured for brightfield, darkfield, and DIC ( Nomarkski) inspection stage has 6x6 xy travel 5 place universal nosepiece CF BD Plan DIC 5x/10x/20x/50x objectives 4 Nomarski prisms...
Zeiss LM100 Inspection Microscope for wafers up to 450mm or flat panels up to 548mmx548mm with motorized stage, brightfield, darkfield, and Nomarski inspection
- Manufacturer: Zeiss
- Model: LM100
Zeiss inspection microscope for large wafers and panels with reflected and transmitted light Brightfield, darkfield, Nomarski (DIC) inspection Merzhauser motorized xy stage with 550mm x 550mm travel (21.6"x21.6...
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Nordson Yestech YTV-FX
- Manufacturer: Nordson
For more information regarding stock and pricing, please click here. Nordson YESTECH YTV-FX in excellent condition. vintage 2011 Specifications: Defects Detected: Part: position, missing, wrong, polarity, skew, t...
Veenendaal, Netherlands - Trusted Seller
CDE ResMap 273 Resistivity Mapping System
- Manufacturer: CDE
- Model: Resmap
CDE ResMap 273 Resistivity Mapping System consisting of:- Manufacturer: Creative Design Engineering - Model: ResMap 273 - PC w/ windows XP- Maximum Throughput: 1 minute per wafer- Measurement Range: 2 mΩ/- 5 MΩ/...
Decatur, GA - Trusted Seller
Tektronix 576
- Manufacturer: Tektronix
- Model: 576
Curve Tracer The Tektronix 576 Curve Tracer is a rugged high power measurement system for tests on 2- and 3-terminal discrete semiconductors. With a collector supply of up to 220 W peak, adjustable current limiti...
Cary, NC - Trusted Seller
Rudolph Research AutoEL Ellipsometer
- Manufacturer: Rudolph Research Analytical
Rudolph Research AutoEL Ellipsometer - Operating wavelength: 632.8nm - Max sample size: 6" x 6" - Resolution & accuracy: - Polarizer or analyzer: 0.05° - Delta: 0.1° - PSI: 0.05° - Measuring time: - Single film:...
Trim, Ireland - Trusted Seller
Reichert-Jung Polyvar MET Microscope
- Manufacturer: Reichert Jung
Reichert-Jung Polyvar MET Microscope Reichert-Jung Polyvar MET microscope operates with bright field (BF), dark field (DF), and polarization modules. System includes eyepiece (WPK 10x), objective (Plan 5x, Pla...
Trim, Ireland - Trusted Seller
Zeiss AXIOMAT NAC Microscope
- Manufacturer: Zeiss
- Model: AXIOMAT NAC
Zeiss AXIOMAT NAC Microscope Zeiss AXIOMAT NAC microscope operates in reflected light with bright field (BF), Nomarski DIC, and polarization modules. System includes: - Stage module A(R) with 5 dovetail slide...
Trim, Ireland - Trusted Seller
AOI Systems Scanner based First Article Inspector
First Article Inspection -The FA-Inspector is a scanner-based optical inspection system used to automate first article inspections and subsequent production inspection tasks without programming. The FA-Inspector ...
Veenendaal, Netherlands - Trusted Seller
AOI Systems Scanner based First Article Inspector
First Article Inspection -The FA-Inspector is a scanner-based optical inspection system used to automate first article inspections and subsequent production inspection tasks without programming. The FA-Inspector ...
Veenendaal, Netherlands - Trusted Seller
2011 Test Reasearch Inc TR7550
- Manufacturer: Test Reasearch Inc
The Test Research Inc. (TRI) TR7550, introduced around 2010, is an Automated Optical Inspection (AOI) system designed for high-speed, inline inspection of printed circuit boards (PCBs) in electronics manufacturin...
Basel, Switzerland